Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...

Semiconductor aging refers to the slow loss of electrical characteristics of the semiconductor device as a result of continuous use or prolonged exposure to various environmental conditions like ...

Jeremy Monaldo, Joseph Valentino Ph.D. On December 1, the United States Patent and Trademark Office launched the Semiconductor Technology Pilot Program. As part of the Office’s efforts to support the ...

A new publication from Opto-Electronic Advances; DOI 10.29026/oea.2025.240159, discusses on-chip light control of semiconductor optoelectronic devices using integrated metasurfaces. Since the initial ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Major processes in semiconductor wafer fabrication: 1) wafer preparation, 2) pattern transfer, 3) doping, 4) deposition, 5) etching, and 6) packaging. The process of creating semiconductors can be ...

India has begun taking steps toward semiconductor-focused education, but there is room to do more ...