Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
Scanning electron microscopes (SEMs) facilitate significant scientific advancements by enabling researchers to investigate the properties of biological specimens and materials. However, traditional ...
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