AZOM

UHR-SEM Combined with FIB for Sample Preparation - TESCAN AMBER

TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ...
AZOM

Sample Preparation for SEM Imaging

insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...
AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
Michigan Technological University

Specimen Preparation

Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...
AZoNano

EM ACE600 Sputter Coater: Sample Preparation of Thin Films

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure With the EM ACE600 sputter coater, users ...
BioTechniques

ZEISS enhances efficiency in multi-scale and multi-modal workflows

Researchers benefit from faster FIB-SEM sample preparation, more accurate 3D tomography and greater integration in data reporting JENA/Germany – Materials and Life Science researchers can now ...
SpaceRef

Video: Ticks Survive and Move in Extreme Environment Inside an Electron Microscope

Observation of Live Ticks (Haemaphysalis flava) by Scanning Electron Microscopy under High Vacuum Pressure, PLoS One “Scanning electron microscopes (SEM), which image sample surfaces by scanning with ...